Oxford Instruments using NPL's non-destructive quality control method to commercialize wafer-scale fabrication of 2D molybdenum disulphide

UK-based Oxford Instruments says that a world-first non-destructive quality control method developed by the UK's National Physical Laboratory (NPL) has enabled it to commercialize wafer-scale fabrication technology for the two-dimensional (2D) semiconducting material molybdenum disulphide (MoS2)...

Source: Semiconductor Today LINK