Currently the fabs are running hot and expanding and 2018 is expected to continue to grow according to OEMs and market research companies like o VLSI Research (CEO Dan Hutcheson, see below). Solid State Technology reports, based on recent market research by The Information Network (LINK) that Market leader Applied Materials lost market shares in 2017 to the main competitor Tokyo Electron and Lam Research.
"Applied Materials 1.3 share points, dropping from 28.2% in 2016 to 26.9% YTD
(year to date). Gaining share are Tokyo Electron Ltd. (TEL), which
gained 2.4 share points while rising from 17.0% in 2016 to 19.4% in
2017 YTD. Lam Research gained 1.6 share points and growing from a 19.0% share in 2016 to a 20.6% share in 2017 YTD."
The three companies compete in the following areas with huge growth due to the memory boom in 2017 (3DNAND and DRAM):
- conductor and dielectric etch equipment
- deposition equipment - single/multiwafer ALD and CVD
CVD equipment share is roughly 3X that of ALD and ALD passed PVD in 2015 (according to VLSI Research). Furnace ALD and CVD is dominated by Tokyo Electron and Kokusai, however it is a smaller segment as compared to single and multi wafer ALD and CVD. ASMI, the leader in ALD single wafer equipment does not seem to have been able to grow with memory, down from 2.0% to 1.7%.
Please find the full article here: LINK
This is the first article this site used my press release and data and didn't include my info, instead sticking in comments from VLSI research making it sound like it came from that company and not The Information Network (www.theinformationnet.com)
ReplyDeleteHi Robert, Please let me know how you want to be referenced. The Information Network (www.theinformationnet.com) is clearly referenced. "Solid State Technology reports, based on recent market research by The Information Network (LINK) that Market leader Applied Materials lost market shares in 2017 to the main competitor Tokyo Electron and Lam Research." The purpose of referencing more than one market research company is to have multipple refernces on the same observation.
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